Product Introduction
The ultrasonic scanning microscope UTC-W20 is used for internal defect detection of materials science, semiconductor industry, and other related products. Using an ultra-high-speed linear motor motion system to drive a high-frequency ultrasonic transducer, conducting water immersion C-scan inspections.
Full-wave array collection of ultrasonic signals is used to effectively identify internal defects in products through imaging algorithms and data image processing capabilities, resulting in clear internal images. It also statistically analyzes the location, shape, and size of defects, generating customized reports.
Product Features
- Applicable Products: Chips, plastic packaged ICs, PCBs, metal substrates, wafers, semiconductor electronics industry;
- High stability and consistency of test results;
- High-speed positioning and rapid imaging;
- Simple operation, safe to use, and diverse formats for test results;
Technical Parameters
Item
Model
Motion System
XY Axis Scanning Range
300*300mm(customizable)
Scanning Speed
1000mm/s
Repeat Positioning Accuracy
1 um
Ultrasonic Emission and Reception
Operating Frequency Range
0.5MHz ~ 60MHz
Excitation Pulse Form
Square Wave
Operating Temperature
-10°C ~ +50°C
Sampling Rate
100MHZ,supports up to 1GHz
Repetition Frequency
20khz
Data Transmission Rate
5G
Number of Sampling Points
4K (customizable)
Gain Adjustment
-13dB~66dB, continuously adjustable by 1dB
Software Functions
A\B\C\D Scanning Images
Interface Tracking, Area Rescanning
Multiple Feature Imaging
Methods
Various Data Processing and Image Processing Methods
Defect Location Statistical Analysis
Database Statistics, Custom Report Templates
Item
Motion System
Ultrasonic Emission and Reception
Software Functions
Model
XY Axis Scanning Range
Scanning Speed
Repeat Positioning Accuracy
Operating Frequency Range
Excitation Pulse Form
Operating Temperature
Sampling Rate
Repetition Frequency
Data Transmission Rate
Number of Sampling Points
Gain Adjustment
A\B\C\D Scanning Images
Multiple Feature Imaging Methods
Defect Location Statistical Analysis
300*300mm (customizable)
1000mm/s
1 um
0.5MHz ~ 60MHz
Square Wave
-10°C ~ +50°C
100MHZ,supports up to 1GHz
20khz
5G
4K(customizable)
-13dB~66dB，continuously adjustable by 1dB
Interface Tracking, Area Rescanning
Various Data Processing and Image Processing Methods
Database Statistics, Custom Report Templates
Partial detection
Product demonstration
