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The ultrasonic scanning microscope UTC-W20 is used for internal defect detection of materials science, semiconductor industry, and other related products. Using an ultra-high-speed linear motor motion system to drive a high-frequency ultrasonic transducer, conducting water immersion C-scan inspections.
Full-wave array collection of ultrasonic signals is used to effectively identify internal defects in products through imaging algorithms and data image processing capabilities, resulting in clear internal images. It also statistically analyzes the location, shape, and size of defects, generating customized reports.