Product Introduction
The ultrasonic scanning microscope UTC-W30 is used for internal defect detection of materials science, semiconductor industry, and other related products. Using an ultra-high-speed linear motor motion system to drive a high-frequency ultrasonic transducer, conducting water immersion C-scan inspections.
Full-wave array collection of ultrasonic signals is used to effectively identify internal defects in products through imaging algorithms and data image processing capabilities, resulting in clear internal images. It also statistically analyzes the location, shape, and size of defects, generating customized reports.
Product Features
- Space-saving**: The integrated design reduces the amount of space the equipment occupies.
- Portability**: The equipment is lighter and easier to move.
- Simplified operation**: It reduces the complexity of user operation, offering a simpler and more intuitive user interface and operation process.
- Low failure rate**: The high integration of the equipment means fewer internal connections compared to separate components, resulting in a lower failure rate and simpler maintenance and repair.
- Nadcap certified**.
New vs. Old Product Comparison
Old Model
- Separate design
- Large footprint, not easy to move
- Complex operation
- Low integration, high maintenance costs
New Model
- Integrated design
- Smaller footprint, more portable
- Simplified operation
- High integration, lower failure rate, and reduced maintenance costs
Software Uniqueness
Detection Software**: Features include A-scan and C-scan displays, motion control interface, ultrasonic inspection parameter settings, interface tracking, region rescan, ABC triple gates, inspection path planning, and the ability to switch between scanning and stepping axes at will.
Analysis Software**: Capable of full waveform data collection, offline data reading, offline analysis of A-scan waveforms at any position, tomographic imaging at any position, and cross-sectional views from any angle (with customizable angle and cross-sectional length).
Defect Statistical Analysis**: Enables the localization, statistical measurement, and analysis of defect areas and sizes.
Sample test results
Model
UTC-W20
UTC-W30
Dimensions
1480*1130*1780
1780*1230*1780
Weight
980±50kg
1500±50kg
Color
Blue, white, and gray
Blue, white, and gray
Structure
Integrated Design
Integrated Design
Detection range
620*688*250
720*980*250
Scanning speed
≤1500mm/s
≤1500mm/s
Repetition accuracy
±1um
±1um
Maximum image resolution
62000*68800
72000*98000
Operating frequency range
1KHz~60MHz (Max 500MHz)
1KHz~60MHz (Max 500MHz)
Sampling rate
2GHz,8-digit（customizable）
2GHz,8-digit（customizable）
Repetition frequency
20khz
20khz
Pulse emission voltage
100 ~475V adjustable, step 1V
100 ~475V adjustable, step 1V
Gain adjustment
-13dB~+66dB，1dB step
-13dB~+66dB，1dB step
Model
Dimensions
Weight
Color
Structure
Detection range
Scanning speed
Repetition accuracy
Maximum image resolution
Operating frequency range
Sampling rate
Repetition frequency
Pulse emission voltage
Gain adjustment
UTC-W20
1480*1130*1780
980±50kg
Blue, white, and gray
Integrated Design
620*688*250
≤1500mm/s
±1um
62000*68800
1KHz~60MHz (Max 500MHz)
2GHz，8-digit（customizable）
20khz
100~475 adjustable, step 1V
-13dB~+66dB，1dB step
UTC-W30
1780*1230*1780
1500±50kg
Blue, white, and gray
Integrated Design
720*980*250
≤1500mm/s
±1um
72000*98000
1KHz~60MHz (Max 500MHz)
2GHz，8-digit（customizable）
20khz
100~475 adjustable, step 1V
-13dB~+66dB，1dB step
